求一篇3000字左右的关于衍射方面的英文资料

X-ray analysis and computer simulation for grain size determination in nanostructured materials

Authors: Alexandrov I.V.1; Enikeev N.A.
Materials Science and Engineering: A, Volume 286, Number 1, 30 June 2000, pp. 110-114(5)

Abstract:

The problems of detailed X-ray characterization of pure nanostructured materials subjected to severe plastic deformation, namely large plastic deformation under applied high pressure without decomposition of a sample, are considered. Computer simulation has been used to interpret obtained experimental results. An analysis of applicability of various X-ray methods for determination of grain size in nanostructured materials has been carried out. Possible dislocation configurations responsible for specific defect structure formation due to severe plastic deformation have been determined.

第2篇是
X-ray peak profile analysis of crystallite size distribution and dislocation type and density evolution in nano