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来源：百度知道 编辑：UC知道 时间：2024/06/17 04:18:52
An IRS study by Zolotarev, veremei, and Gorbunova of SiO films deposited on Ge has shown the presence of an absorption band which is absent in transmission spectra. The explanation for this must be the presence of a longitudinal electric field associated with the standing wave at the reflecting interface for internal reflection which, of course, is absent for propagating waves (transmission spectra).
This section has given some examples of the application of internal reflection spectroscopy to the study of surfaces and thin films. Many other workers are applying these techniques to similar studies and thus additional publications should be anticipated. The potential application of internal reflection techniques as an investigative tool has been far from exhausted. As an example, thousandfold sensitivity enhancements over conventional techniques have been obtained in the study of bulk materials and thin films via internal reflection fluorescence spectroscopy. Investigation is curre
This section has given some examples of the application of internal reflection spectroscopy to the study of surfaces and thin films. Many other workers are applying these techniques to similar studies and thus additional publications should be anticipated. The potential application of internal reflection techniques as an investigative tool has been far from exhausted. As an example, thousandfold sensitivity enhancements over conventional techniques have been obtained in the study of bulk materials and thin films via internal reflection fluorescence spectroscopy. Investigation is curre
由SiO影片Zolotarev， veremei和Gorbunova的联邦税务局研究在Ge放置的显示了吸收带宽的出现哪些是缺席的在传输光谱。 此的解释必须是一个纵向电场的出现与定波相关在，当然，为繁殖波浪的内部反射的反射的接口(传输光谱)是缺席的。
This部分举内部反射分光学的应用的有些例子表面和薄膜的研究。 许多其他工作者申请这些技术于相似的研究，并且应该因而期望另外的出版物。 内部反射技术的潜在的应用作为一个调查工具是远离用尽。 例如，在常规技术的敏感性改进在粒状材料和薄膜的研究中千倍地得到了通过内部反射荧光分光学。 调查当前是进行中评估它的潜力在喇曼分光学方面。